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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics) Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics) by Otwin Breitenstein,Wilhelm Warta,Martin Langenkamp

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

by Otwin Breitenstein,Wilhelm Warta,Martin Langenkamp


ISBN 13: 9783642024160

Format: Hardcover (255 pages)
Publisher: Springer
Published: 05 Sep 2010

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New : $115.23